Earners of this badge are able to design better quality products that can be reliably manufactured in large quantities through exposure to VLSI test principles and DFT architecture. They also understand the importance of VLSI Testing, Test process and Automatic Test Equipment, Defects versus Fault models, Fault simulation, Circuit Testing, Memory Testing, Design-for-Testability, Scan Design, Boundary Scan, Built-in-Self Test, Delay Test, and Advanced Fault models etc.

• Type Learning
• Time Days