Introduction to Scanning Electron Microscopy (SEM)

Introduction to Scanning Electron Microscopy (SEM)

Issued by Northeastern University

The earner of this badge learned the fundamentals of the electron optics system and the signals produced during electron beam-sample bombardment in the SEM. They learned the principles of secondary electron (SE) and backscattered electron (BSE) imaging techniques as well as energy dispersive spectroscopy (EDS) to collect particular types of information about samples. The earner learned to operate an SEM and utilize these techniques independently.

Skills

Earning Criteria

  • Complete the non-credit course, PHYS 0510: Introduction to Scanning Electron Microscopy
  • Understand the basics of electron-optics system in an SEM
  • Collect high resolution images from an organic or inorganic sample
  • Analyze the chemistry of the sample using EDS system
  • Operate the SEM independently
  • Demonstrate the ability to prepare a non-conductive material for SEM